http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101846991-B1

Outgoing Links

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
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filingDate 2016-08-11^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-04-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2018-04-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101846991-B1
titleOfInvention SiGe P-CHANNEL TRI-GATE TRANSISTOR BASED ON BULK SILICON AND FABRICATION METHOD THEREOF
abstract The present invention relates to a method for manufacturing a semiconductor device comprising the steps of protruding a silicon fin on a bulk silicon substrate and forming a thin silicon germanium active layer on the three sides of the silicon fin to form a well hole on three sides between the gate insulating film and the silicon pin, And the holes gathered in the respective wells move along the active layer on each side of the high mobility of the holes, so that the body biasing can be performed by the integrated structure between the silicon pin and the body as well as the ultra high-speed and low- Channel triple gate transistor that can be fabricated together with an n-channel finFET (FinFET) type transistor in the same CMOS process on one substrate, and a method of manufacturing the same.
priorityDate 2016-08-11^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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