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filingDate 2005-03-25^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45daba8c5c65e2b6f8099b569affbc52
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publicationDate 2007-01-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20070004881-A
titleOfInvention Method for forming oxynitride film and nitride film, forming apparatus, oxynitride film, nitride film and substrate
abstract There is no dependence on the nitriding time and nitriding temperature of the nitriding reaction, and low temperature and high-speed nitriding are possible, and a uniform nitride film and an oxynitride film are formed. It is obtained by providing a solid dielectric on at least one opposing surface of a pair of opposing electrodes under a pressure of 300 Torr or higher, and applying an electric field by introducing nitrogen gas containing 0.2% or less of oxide between the pair of opposing electrodes. N 2 (2 nd ps) or N 2 (HIR) active species plasma is contacted with the workpiece to form a nitride film / oxynitride film on the surface of the workpiece.
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