http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201530651-A

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filingDate 2014-10-20^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_165251ceab59d0da18338a5767bf8f31
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publicationDate 2015-08-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201530651-A
titleOfInvention Particle generation suppressor by DC bias adjustment
abstract Embodiments of the present disclosure generally relate to apparatus and methods for reducing particle generation in a processing chamber. In one embodiment, the method generally includes: generating a plasma between a powered top electrode and a grounded bottom electrode, wherein the top electrode is parallel to the bottom electrode; and applying a during a film deposition process A constant zero DC bias voltage is applied to the top electrode of the supply to minimize the potential difference between the powered top electrode and the plasma and/or the potential difference between the grounded bottom electrode and the plasma. Minimizing the potential difference between the plasma and the electrodes reduces particle generation because the acceleration of the plasma in the sheath region of the electrodes is reduced, and the plasma and the protective coating on the electrodes The collision force is minimized. Therefore, particle generation on the surface of the substrate is reduced.
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priorityDate 2013-11-06^^<http://www.w3.org/2001/XMLSchema#date>
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