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filingDate 2020-05-11^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2021-02-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-202105740-A
titleOfInvention An enhancement mode metal insulator semiconductor high electron mobility transistor
abstract An enhancement mode metal insulator semiconductor high electron mobility transistor (HEMT) is presented herein. By using a polarization stack to replace the traditional barrier layer, a thinner barrier layer (e.g., a thinner layer of AlGaN) may be formed during fabrication to effectuate a low-sheet-resistance two-dimensional electron gas. Advantageously, the thinner (i.e., less-than-ten nanometers) barrier layer mitigates reactive ion etching (RIE) induced surface damage. This in turn allows the formation of a recessed gate. Additionally, a dual dielectric gate stack may be deposited to further reduce leakage currents and to improve subthreshold slope.
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