http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-202233875-A

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filingDate 2021-11-02^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0a2e5f740ccb60abdffe52be720174b0
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publicationDate 2022-09-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-202233875-A
titleOfInvention Method for filling recessed features in semiconductor devices with a low-resistivity metal
abstract A method for filling recessed features with a low-resistivity metal includes providing a patterned substrate containing a recessed feature formed in a first layer and a second layer that is exposed in the recessed feature, pre-treating the substrate with a surface modifier that increases metal deposition selectivity on the second layer relative to on the first layer, and depositing a metal layer on the substrate by vapor phase deposition, where the metal layer is preferentially deposited on the second layer in the recessed feature. The method further includes removing metal nuclei deposited on the first layer, including on a field area and on sidewalls of the first layer in the recessed feature, to selectively form the metal layer on the second layer in the recessed feature, where the removing includes exposing the patterned substrate to an etching gas containing ozone.
priorityDate 2020-11-03^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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