| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_526cb931f1382d6e016ee651d55e1365 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-123
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-1023 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318502
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N17-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N17-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M1-1071 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-12 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-369
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-374
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-378
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N5-335
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03M1-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04N17-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-146 |
| filingDate |
1999-03-17^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2000-12-11^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ac0b037bc4a70cbb3fac9b5d66ea832a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7cbcdf454e45bcb4125730d3ef114f61
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c16442c272e0785a1844abcbd06fd374
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5bf2a88d40e269d78a020fa51fb1d08 |
| publicationDate |
2000-12-11^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-414922-B |
| titleOfInvention |
CMOS image sensor with testing circuit for verifying operation thereof |
| abstract |
The present invention relates to a picture display using CMOS (Complementary Metal Oxide Semiconductor) image sensor; and, more particularly, to a CMOS image sensor having a testing circuit embedded therein and a method for verifying operation of the CMOS image sensor using the testing circuit. The CMOS image sensor according to the present invention includes a control and interface unit for controlling its operation sensor using a state machine and for interfacing the CMOS image sensor with an external system; a pixel array including a plurality of pixels sensing images from an object and generating analogue signals according to an amount of incident light; a converter for converting the analogue signals into digital signals to be processed in a digital logic circuit; and a testing circuit for verifying operations of the converter and the control and interface unit, by controling the converter. |
| priorityDate |
1998-02-28^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |