http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-553796-B

Outgoing Links

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filingDate 2000-11-03^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2003-09-21^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e0da46784561a31e772e95a0226ade17
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_10050746295f176185ac38729402b0f4
publicationDate 2003-09-21^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-553796-B
titleOfInvention Polishing process for use in method of fabricating semiconductor device
abstract First, in a primary polishing step, a substrate is brought into close contact with a first pad including abrasives and made of a hard material, and the first pad is rotated while a first solution containing no abrasive is supplied onto the first pad to polish a surface of the substrate. In the primary polishing step, since the first solution contains no abrasive and the first pad is hard, polishing is performed with high flatness and extremely less dishing and erosion. Next, in a secondary polishing step, the substrate is brought into close contact with a second pad including no abrasive and made of a soft material, and the second pad is rotated while a second solution containing abrasives is supplied onto the second pad to polish the surface of the substrate. In the secondary polishing step, since the second solution contains the abrasives and the second pad is soft, scratches produced in the primary polishing step are reduced.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113579992-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104576356-A
priorityDate 1999-11-05^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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