http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-589710-B

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_38ed56a4b4e8e2315b2b3308bffedb3f
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 2002-09-18^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2004-06-01^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5d68943c9f339c56e4d52676ea751376
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27d5e02520f3050ff3402fd7bc1a17f6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bb3010384e6abd4c7231c96ab628a632
publicationDate 2004-06-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-589710-B
titleOfInvention Metal interconnect with cap layer and manufacturing method thereof
abstract This invention provides a metal interconnect with cap layer, whose manufacturing method comprises, firstly, providing a semiconductor substrate with a dielectric layer formed thereon a metal interconnect; and then forming a plurality of barrier layers on the dielectric layer and the metal interconnect, in which the barrier layers are combinations of silicon carbide compound layer and pure silicon carbide layer.
priorityDate 2002-09-18^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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