http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I260068-B

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76885
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-4763
filingDate 2005-09-30^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-08-11^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bb3010384e6abd4c7231c96ab628a632
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27d5e02520f3050ff3402fd7bc1a17f6
publicationDate 2006-08-11^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I260068-B
titleOfInvention Methods for forming semiconductor device and interconnect
abstract A method for forming a semiconductor device having an extreme low-k dielectric (ELK), the method comprises removing substantially all of a first dielectric formed between adjacent interconnects using an anisotropic etch and then using an isotropic etch, wherein using an anisotropic etch comprises using an interconnect as a mask. A space between the adjacent interconnects is filled with the extreme low-k dielectric. A method for forming interconnect is also provided.
priorityDate 2005-03-28^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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