http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I331794-B

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3a2f00e72ba6e4c09b6da573427fbed
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-826
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-066
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-8833
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-8418
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-8836
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-00
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8242
filingDate 2006-08-15^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2010-10-11^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a678aa45f759fe2611cf725631b32626
publicationDate 2010-10-11^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I331794-B
titleOfInvention Reproducible resistance variable insulating memory devices and methods for forming same
abstract The present invention relates to the use of a shaped bottom electrode in a resistance variable memory device (301). The preferably cone-like shaped bottom electrode (308) ensures that the thickness of the insulating material (312) at the tip of the bottom electrode is thinnest, creating the largest electric field at the tip of the bottom electrode. The arrangement of electrodes (308, 310) and the structure of the memory element makes it possible to create conduction paths with stable, consistent and reproducible switching and memory properties in the memory device.
priorityDate 2005-08-15^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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