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filingDate 2016-05-11^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-08-21^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52aa65e80193fa8968359416573448b7
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publicationDate 2018-08-21^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10056472-B2
titleOfInvention Method for forming semiconductor structure with contact over source/drain structure
abstract A semiconductor structure and a method for forming the same are provided. The method includes forming a source/drain structure in a substrate and forming a metal layer over the source/drain structure. The method for manufacturing a semiconductor structure further includes performing an annealing process such that a portion of the metal layer reacts with the source/drain structure to form a metallic layer on the source/drain structure. The method for manufacturing a semiconductor structure further includes performing an etching process to remove an unreacted portion of the metal layer on the metallic layer and forming a contact over the metallic layer. In addition, the etching process includes using an etching solvent, and the etching solvent includes (a) a first component, including H 2 SO 4 , HCl, HF, H 3 PO 4 , or NH 4 OH and (b) a second component, including propylene carbonate, ethylene carbonate, diethyl carbonate, acetonitrile, or a combination thereof.
priorityDate 2014-08-29^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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