http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11047932-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b0f690e6c71b11ada049753d412ab9ca |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-12 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-2028 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R33-0094 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R33-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R33-02 |
| filingDate | 2020-03-13^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2021-06-29^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4090b5293f3a4f78a3878e52f419a844 |
| publicationDate | 2021-06-29^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-11047932-B2 |
| titleOfInvention | Determining composition of metal artifacts using dynamic electromagnetic profile measurements |
| abstract | An apparatus determines the composition of a metal artifact. The apparatus includes an electrical current source, a metal artifact to be tested, two electrical cables, and a first electrical cable and a second electrical cable different from the first electrical cable. Each of the first electrical cable and the second electrical cable is connected between the electrical current source and the metal artifact. During a test, the electrical current source outputs current. When the electrical current source outputs the current, the current travel through at least a portion of the metal artifact. The apparatus further includes a magnetic field sensor that detects, during the test, a magnetic field generated by the metal artifact when the current travels through the at least the portion of the metal artifact. The magnetic field sensor is disposed within a predetermined distance of the metal artifact during the test. |
| priorityDate | 2020-03-13^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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