http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11355465-B2

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filingDate 2018-09-27^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2022-06-07^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e243494290caec69906416a056efde0
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publicationDate 2022-06-07^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11355465-B2
titleOfInvention Semiconductor device including glass substrate having improved reliability and method of manufacturing the same
abstract The present technology relates to a semiconductor device and a method of manufacturing the same capable of improving reliability of a glass substrate on which a wiring layer is formed. A semiconductor device is provided with a glass substrate on a front surface or front and back surfaces of which a wiring layer including one or more layers of wiring is formed, an electronic component arranged inside a glass opening formed on the glass substrate, and a redistribution layer that connects the wiring of the glass substrate and the electronic component. The present technology is applicable to, for example, a high-frequency front-end module and the like.
priorityDate 2017-10-11^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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