http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11493465-B2

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-24
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filingDate 2020-10-30^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2022-11-08^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f934b803646042cf01eeb8b6486eb4d
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publicationDate 2022-11-08^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11493465-B2
titleOfInvention Multi-frequency dielectric coaxial probe for formation analysis
abstract Systems and methods to evaluate a formation by analyzing drill cuttings involve a multi-frequency dielectric coaxial probe to obtain a reflected voltage from a medium under test based on a reference voltage over a frequency range. The medium under test includes the drill cuttings. The system includes a processor to compute an effective permittivity of the drill cuttings over the frequency range based on a reflection coefficient, which is a ratio of the reflected voltage to the reference voltage over the frequency range, and to determine one or more parameters from the effective permittivity. The one or more parameters are used to make decisions about subsequent drilling in the formation.
priorityDate 2019-10-31^^<http://www.w3.org/2001/XMLSchema#date>
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