http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005254065-A1

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filingDate 2005-05-11^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2005-11-17^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2005254065-A1
titleOfInvention Method and apparatus for detecting surface characteristics on a mask blank
abstract An optical system and method configured to detect surface height variations on a mask blank. The optical system comprises a Wollaston prism, optics and first and second detectors. The Wollaston prism splits an incident beam of radiation into a first beam and a second beam. The first beam has a first polarization. The second beam has a second polarization. The optics directs the first and second beams along first and second paths onto first and second illuminated areas on a surface of the mask blank. The first and second illuminated areas reflect or transmit portions of the first and second beams to produce first and second reflected or transmitted beams. The first and second detectors detect the first and second reflected or transmitted beams and produce first and second signals in response to the first and second reflected or transmitted beams. A multiple way coupler may also be used for detecting height variation or other features on a mask blank. Two substantially parallel optical incident radiation beams are transmitted to the mask blank. The multiple way coupler mixes portions of the two beams after they have been reflected or transmitted by two different areas of said mask blank to provide three or more outputs which can be analyzed to provide information on height variation or other features on the mask blank.
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