| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fc4d0d5ddae564270b34d79c5ddc5b86
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_55d9c980497131180834329cdaa52f61
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23f5f2281a2afdbc359043e0c4d86f5a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c7d77b43d2e928a86235d286de728e3f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3eb19a0bac66b39ec288de8f6b3b7033 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-076 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-223 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-36 |
| filingDate |
2005-08-05^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cc61dcbcce3de26ba65e6edf5fadcba0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80004eb65411803b9364b24d41978e08
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6a8c0ca2906a73d7834e736f065f1362
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_520649ac418d2426947a243ecdcac678
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9bc045c3f60a50ea4e986b33f5d10ef4 |
| publicationDate |
2006-02-09^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2006029182-A1 |
| titleOfInvention |
Fluorescent X-ray analysis method and fluorescent X-ray analysis apparatus |
| abstract |
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011211670-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10539520-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009262889-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009071002-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009129479-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10705034-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7899153-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10916334-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007229800-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3327600-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102015221323-B3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014035334-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8693625-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7289598-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7483124-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006093085-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2039883-A3 |
| priorityDate |
2004-08-06^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |