http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006115979-A1

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filingDate 2004-11-30^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_078cc7194ac4d1efa7b195df372ad974
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publicationDate 2006-06-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2006115979-A1
titleOfInvention Plasma etch process for multilayer vias having an organic layer with vertical sidewalls
abstract A process is provided for fabricating a via 52 between bonded wafers without undercutting an organic bonding material 32 . The process for forming the via 52 in a structure including a dielectric material 14 and an organic bonding material 32 , comprises forming a resist material 42 on the dielectric layer 14 and etching through the dielectric layer 14 and the organic bonding material 32 with 60CF 4 /20Ar/60CHF 3 /20N 2 . The resist may then be removed with an anisotropic high density oxygen plasma.
priorityDate 2004-11-30^^<http://www.w3.org/2001/XMLSchema#date>
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