Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3cda939b335d9d2656852328d9ed6132 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01P13-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-2605 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01H13-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01H11-06 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01H11-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01H13-00 |
filingDate |
2013-02-20^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4c513c1e7307d7988e28fa38de4a98a0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_27b2531eccfc596875a7492abc32bb4f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_98b74460594ad561ca0e6996371c3959 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_efa6f2ec2a60594d302fc510d65f794f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_90756c7a85166de10d44b830669f5cd2 |
publicationDate |
2014-08-21^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-2014230553-A1 |
titleOfInvention |
Method of Detecting Movement Using a Metallic Conductors |
abstract |
A method for monitoring movement of an element such as a cable is carried out by providing a pair of conductive elements each extending along an extent of the cable or other element to be monitored. A DC potential difference is applied between the conductive elements. The conductive elements are provided with an intervening material therebetween, which can be a continuous dielectric or can be other insulating material which varies in spacing and capacitance value along its length, such that the movement causes a change in capacitive coupling between the conductive elements at points or areas where the movement occurs so as to generate a changing voltage therebetween. The changing voltage as an amplified and filtered variable electrical signal is analyzed for monitoring the changing voltage for perturbations caused by the movement of the element. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I580245-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10667341-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10174931-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9846187-B2 |
priorityDate |
2013-02-20^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |