http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2015261636-A1

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-073
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-27
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filingDate 2014-03-17^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f8a70866002a3383f73b394bbb6136e
publicationDate 2015-09-17^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2015261636-A1
titleOfInvention Data transformations to improve rom yield and programming time
abstract Methods and systems for generating data transformations to improve ROM yield and programming time. A bit flip register can be configured in association with the ROM and a binary string can be read into the bit flip register on reset. Subsequently, data output from the ROM can be selectively complemented utilizing a content of the bit flip register and the content of the bit flip register can be programmed into the ROM in order to reduce programming time for each ROM. A defective cell can be tolerated by selectively flipping a column with respect to the defective cell to improve yield. A built-in self-test (BIST) engine that generates addresses up to and including content of an address limiting register can be employed to limit the ROM access to a programmed part during testing in order to tolerate defects in any unused location.
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