| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8d629238b5c0aada2fc57fa5dbb59a41 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-3011
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-05553
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-30107
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5227
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-19041
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-49175
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-48247
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L7-0891 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-345
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C5-143
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L7-1976
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03B5-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-315
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L7-07
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L1-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L1-027
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L1-026
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03B5-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03L7-099 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03L1-02 |
| filingDate |
2015-09-14^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5e74e1c684dea367333c61ad42117792 |
| publicationDate |
2016-01-07^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2016006440-A1 |
| titleOfInvention |
Systems and methods for configuring a semiconductor device |
| abstract |
A system for configuring a semiconductor device to generate an output signal. The system includes a temperature sensor configured to sense a plurality of operating temperatures of the semiconductor device, the plurality of operating temperatures including at least a first operating temperature and a second operating temperature. A controller is configured to determine a plurality of operating frequencies of the output signal at respective operating temperatures of the plurality of operating temperatures. The plurality of operating frequencies include a first operating frequency of the output signal when the semiconductor device is at the first operating temperature and a second operating frequency of the output signal when the semiconductor device is at the second operating temperature. Memory is configured to store calibration information that associates each of the plurality of operating temperatures of the semiconductor device with respective operating frequencies of the plurality of operating frequencies. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107257240-A |
| priorityDate |
2002-10-15^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |