| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-0409
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F2212-7201
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2211-4061
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-4402 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-40615
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F12-0246
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C14-0018
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C7-1072
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-005 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C7-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F12-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-406
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C14-00 |
| filingDate |
2015-10-05^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c949f196fb4d85fdf4e36c84712797e0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3d4d8d66c18ce2185a1bcfe558a37718
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_de10d620b06140683c681d5e2f579905 |
| publicationDate |
2016-04-14^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2016104522-A1 |
| titleOfInvention |
Method of use time management for semiconductor device and semiconductor device including use time managing circuit |
| abstract |
A use time managing method of a semiconductor device may include (1) measuring an amount of accumulated operation time of the semiconductor device and when the amount is reached to a predetermined value, generating a unit storage activation signal; (2) repeating step (1) to generate one or more additional unit storage activation signals, thereby generating a plurality of unit storage activation signals, wherein the predetermined values are different for each repeating step; (3) storing data indicating each occurrence of generating the unit storage activation signals; and (4) detecting use time of the semiconductor device based on the cumulatively stored data. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11275708-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10430372-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10990553-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10503405-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2018024963-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016231929-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2016132458-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10853304-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10901936-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10606789-B2 |
| priorityDate |
2014-10-13^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |