http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017148867-A1

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filingDate 2017-02-08^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-05-25^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017148867-A1
titleOfInvention Etchstop layers and capacitors
abstract Capacitor structures for integrated circuit devices are provided. Capacitors include proximate dense or highly dense etchstop layers. The dense or highly dense etchstop layer is, for example, a high-k material. Capacitors are, for example, metal-insulator-metal (MIM) capacitors and are useful in DRAM (dynamic random access memory) and eDRAM (embedded dynamic random access memory) structures.
priorityDate 2011-11-03^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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