http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017346552-A1

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filingDate 2017-08-16^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-11-30^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017346552-A1
titleOfInvention Built-in self test for loopback on communication system on chip
abstract In an example, the present invention includes an integrated system-on-chip device. The device is configured on a single silicon substrate member. The device has a data input/output interface provided on the substrate member. The device has an input/output block provided on the substrate member and coupled to the data input/output interface. The device has a signal processing block provided on the substrate member and coupled to the input/output block. The device has a driver module provided on the substrate member and coupled to the signal processing block. In an example, the device has a driver interface provided on the substrate member and coupled to the driver module and configured to be coupled to a silicon photonics device. In an example, a control block is configured to receive and send instruction(s) in a digital format to the communication block and is configured to receive and send signals in an analog format to communicate with the silicon photonics device.
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