http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2021335664-A1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-033
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filingDate 2021-04-22^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e5f0105a09a4b6cd8dc37cb7ed8b6c0c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4b32fd4e77b068f6952b6456893d8d4a
publicationDate 2021-10-28^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2021335664-A1
titleOfInvention Patterning method
abstract A method that provides patterning of an underlying layer to form a first set of trenches and a second set of trenches in the underlying layer is based on a combination of two litho-etch (LE) patterning processes supplemented with a spacer-assisted (SA) technique. The method uses one or more first upper blocks formed by a tone-inversion approach, an upper memorization layer allowing first memorizing upper trenches, and then second upper blocks, and a lower memorization layer allowing first memorizing first lower trenches and one or more first lower blocks, and then second lower trenches and one or more second lower blocks.
priorityDate 2020-04-23^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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