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http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-4091
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-4091
filingDate 1978-05-18^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 1980-07-15^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4213139-A
titleOfInvention Double level polysilicon series transistor cell
abstract A pair of MOS transistors are formed as an integrated semiconductor device, sharing a common source/drain region which is created by the edges of inverted regions beneath the gates of the transistors. These gates are first and second level polysilicon, with the second partly overlapping the first. On the opposite ends, the source and drain regions are formed by diffusion using the oxide under the first and second level poly as the diffusion mask.
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