| abstract |
A new type of x-ray fluorescence detector is disclosed that utilizes the measured intensities of fluorescent L alpha and L beta x-rays, or K alpha and K beta x-rays of a target element, to determine the absorption of the covering layer over the target element, without a priori knowledge of the concentration of the target element. The detector uses a source of initiating photons whose energy is in a specific range, a detector of the characteristic lead L or K x-rays with sufficient energy resolution to measure the intensities of the L alpha and L beta rays separately. The detector will, in a rapid, non-destructive manner, provide information as to the depth that the lead paint is beneath the surface. This information is of use to those who mitigate a lead-paint infested area. |