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filingDate 1998-04-30^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2000-05-30^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1875a1f201a5921da4e2a3c4dee6bdb
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publicationDate 2000-05-30^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6069086-A
titleOfInvention Non-HBr shallow trench isolation etch process
abstract An etchant composition for etching straight walled, tapered trenches in silicon comprising chlorine, nitrogen and a mixture of helium and oxygen. The resultant trenches can be readily filled with a dielectric material without the formation of voids. The etchant of the invention is less corrosive, and thus provides increased chamber life and reduced costs over hydrogen bromide-containing etchants.
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