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filingDate 2002-04-15^^<http://www.w3.org/2001/XMLSchema#date>
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inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cad17be722e04d47c4955ae2edfdd825
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publicationDate 2003-02-04^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6515367-B1
titleOfInvention Sub-cap and method of manufacture therefor in integrated circuit capping layers
abstract An integrated circuit and manufacturing method therefor is provided having a semiconductor substrate with a semiconductor device. A device dielectric layer is formed on the semiconductor substrate, and a channel dielectric layer formed on the device dielectric layer has an opening formed therein. A barrier layer lines the channel opening, and a conductor core fills the opening over the barrier layer. Self-aligned sub-caps of silicide and/or oxides are formed over the conductor core and then capped by a capping layer which covers the sub-caps and the channel dielectric layer.
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