http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6528382-B2

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filingDate 2001-06-19^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2003-03-04^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d328a2175c7084e2f83c13f914657bee
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publicationDate 2003-03-04^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6528382-B2
titleOfInvention Semiconductor device and method for fabricating the same
abstract A semiconductor device comprises a silicon substrate 10 of a resistivity above or equal to 800 Ω·cm and an oxygen concentration under or equal to 5×10 17 cm −3 , and an inductor 32 b formed in the silicon substrate. A concentration of oxygen contained in the silicon substrate is set to be low, whereby the silicon substrate is less vulnerable to thermal donor effect, and even in a case that a silicon substrate of high resistivity is used, a semiconductor device which suppresses conversion of a conduction type of the silicon substrate while having an inductance of high Q. It is not necessary to bury a highly resistive layer in the silicon substrate, whereby a semiconductor device having an inductance of high Q can be fabricated by simple fabrication steps, which contributes to cost reduction of the semiconductor device.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8426293-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I478336-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2003077845-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7973313-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2004164302-A1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6707116-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008265376-A1
priorityDate 2000-11-28^^<http://www.w3.org/2001/XMLSchema#date>
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