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filingDate 2001-12-07^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2003-09-30^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6628748-B2
titleOfInvention Device and method for analyzing atomic and/or molecular elements by means of wavelength dispersive X-ray spectrometric devices
abstract In a device and a method for the analysis of atomic and molecular elements by way of wavelength dispersive x-ray spectrometric structures including at least one mirror or focussing device having a multi-layer structure onto which fluorescent radiation generated by primary x-ray or electrons beams from a sample to be examined is directed and the reflected fluorescence radiation is supplied to a measuring device for determining the nature of impurities contained in the sample, the multi-layer structure consists of at least a lanthanum layer and a boron carbide layer.
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