| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_114e4423ec77cbc8dab9d0a98909704e |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-55 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-55 |
| filingDate |
2003-01-14^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2005-11-08^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c7d7418a50e2ecc16c49167a9abfe82a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aed1ea21e3e0be979ed3f23fb5b57f88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e28582bb9f9e717cb0aa28f0d59fe20d |
| publicationDate |
2005-11-08^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-6963403-B2 |
| titleOfInvention |
Method for determining the reflectance profile of materials |
| abstract |
The present invention relates to a method for determining the reflectance profile of materials and more particularly, the present invention relates to a method for calculating specular and diffuse reflectance and hence, the emittance of materials at ambient temperatures. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008270063-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8730240-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008268110-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7892584-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2006050029-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2006050029-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7880881-B2 |
| priorityDate |
2002-01-15^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |