http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7284141-B2

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3d7a919347e3146416bf380258a60cd1
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F1-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F3-05
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F1-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F3-05
filingDate 2004-02-05^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2007-10-16^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_85f6632dd41772f29b5d2b3aa598d57f
publicationDate 2007-10-16^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7284141-B2
titleOfInvention Method of and apparatus for measuring jitter and generating an eye diagram of a high speed data signal
abstract A sampling system is disclosed which measures high speed data signals by performing sampling events at intervals determined by a programmable DDS output frequency and a programmable counter. The reference frequency of the DDS is that of a clock signal that is synchronous with the data signal to be measured. The present invention is able to arrange the sample points to form an eye diagram of the input signal. In addition, the present invention is capable of sampling synchronously with the data clock and controlling the phase of the synthesized signal such that the samples are localized around the rising and falling edges of the data waveform. The present invention is thereby able to determine the location of the edges of the data signal and analyze the deterministic jitter of the waveform.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10788529-B1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10386444-B1
priorityDate 2004-02-05^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7156993

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