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publicationDate 2009-09-29^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7595269-B2
titleOfInvention Semiconductor device comprising a copper alloy as a barrier layer in a copper metallization layer
abstract By forming a tin and nickel-containing copper alloy on an exposed copper surface, which is treated to have a copper oxide thereon, a reliable and highly efficient capping layer may be provided. The tin and nickel-containing copper alloy may be formed in a gaseous ambient on the basis of tin hydride and nickel, carbon monoxide in a thermally driven reaction.
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