| abstract |
Multibeam field emission x-ray systems and related methods can include cathode elements, an anode assembly spaced from the plurality of cathode elements, and an extraction gate positioned between the plurality of cathode elements and the anode assembly. A potential difference can be applied between the extraction gate and at least one of the cathode elements to cause an emission of electrons from the respective cathode elements. Emission characteristics of the cathode elements can be measured, and the potential difference between the extraction gate and at least one of the cathode elements can be adjusted based on the emission characteristics measured. |