http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8731852-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_98d86ea994f7ef8c8bf46d176ee5ca2e http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b2bed4b4d247d7fe14cfd9610d22c463 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67271 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-72 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2656 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N25-72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00 |
| filingDate | 2011-09-28^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2014-05-20^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_60b7cb5e96d26048fcfc4d9198af78ce |
| publicationDate | 2014-05-20^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-8731852-B2 |
| titleOfInvention | Method for analysing photovoltaic layer systems using thermography |
| abstract | A method for the evaluative analysis of a photovoltaic layer system is described. The method applies to a semiconductor layer forming a pn junction: an electric current is generated in the layer system; a spatially resolved thermal image of the surface of the layer system is generated; an intensity distribution of the thermal radiation relative to the respective number of pixels with the same intensity value is determined; an intensity mean/median from the intensity distribution is determined; an intensity interval based on a specifiable measure for a scattering of the intensity distribution is determined; a characteristic number is determined; and the characteristic number or a calculation value based thereon is compared with a specifiable reference characteristic number. |
| priorityDate | 2010-09-28^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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