http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8805115-B2

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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V20-194
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N25-683
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-46
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-40
filingDate 2012-11-02^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-08-12^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1fcd27ab9e11631877e3a72d6f57b7ab
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_77b55b719ab01dd9c6b7669c5e5c8a22
publicationDate 2014-08-12^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-8805115-B2
titleOfInvention Correction of variable offsets relying upon scene
abstract In accordance with various aspects of the disclosure, a method, system, and computer readable media having instructions for processing images is disclosed. For example, the method includes determining a suspicious pixel suspected of causing an artifact in a measurement as a function of a statistical analysis of a collection of samples representing residual error values associated with a subject focal plane pixel measuring one waveband at different times. Based on the determination of the suspicious pixel, a pattern of residual error values is identified that is indicative of the artifact caused by the suspicious pixel. A correcting time-dependent offset determined that is substantially reciprocal to the identified pattern of residual error values. The correcting time-dependent offset is applied to the measurement to correct for artifact in the measurement.
priorityDate 2012-11-02^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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