http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9638749-B2
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d527f9a5c3e991a1797de3518a88d14 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2893 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-01 |
| filingDate | 2015-06-10^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2017-05-02^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_90555fd6278ff2959a0767d21e79c44f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5395b407a8c84324542fd90225247e3c |
| publicationDate | 2017-05-02^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | US-9638749-B2 |
| titleOfInvention | Supporting automated testing of devices in a test floor system |
| abstract | In an embodiment, a test floor apparatus includes at least one conveyor, a vertical stack buffer, and an automated handling station. The vertical stack buffer is operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle. The automated handling station is operable to access the DUT receptacle from the at least one conveyor and is operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT. |
| priorityDate | 2014-06-06^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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