http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9958319-B2

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filingDate 2013-04-05^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-05-01^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a98fe70f62b849f220cb17c50bab0892
publicationDate 2018-05-01^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9958319-B2
titleOfInvention Method and device for determining a critical angle of an excitation light beam
abstract A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence.
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