| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_563e7d4dc75a15dcecdc3cdcc7df989e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a2979af08353966e7c6462ccaa654592
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_df74e7352f6daaa16002eec3eefa92de |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04W36-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04W88-02 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04B17-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04W24-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04W16-22 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04W88-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04W36-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04W16-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04B17-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04W24-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04B7-26 |
| filingDate |
2003-07-09^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_720c4d59628a5396b78b7ba750e3065a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f4c2bbe55cdaffbe8cad94a31fe6c0b6 |
| publicationDate |
2004-01-29^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2004010619-A1 |
| titleOfInvention |
Time delay evaluation |
| abstract |
The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method comprises the steps of: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modelling a first probability distribution (P1) as a function of the elapsed time from the first occurrence of the first event to the first occurrence of the second event; obtaining a second probability distribution (P2) as a function of the elapsed time from the first occurrence of the first event to the N-th occurrence of the second event; performing a statistical transformation in order to obtain a third probability distribution (P3) as a function of the N-th occurence of the second event; deciding to pass the device under test, according to the comparison of P3 with the test limite. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019147305-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8688051-B2 |
| priorityDate |
2002-07-19^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |