Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5227534d5452763715e3b63f856057cf http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5c8b80bed37e05ef541d04b571e68a56 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-4441 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-4021 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J35-153 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J35-147 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J35-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05G1-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-405 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J35-305 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-54 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J35-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2252 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05G1-46 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J35-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J35-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J35-26 |
filingDate |
2013-05-17^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_883d8f90b6db88b4dd17f3d3960e979a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_88acec9e83c51d4922f87271a31f2cea |
publicationDate |
2013-11-28^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2013175370-A1 |
titleOfInvention |
Blanking of electron beam during dynamic focal spot jumping in circumferential direction of a rotating anode disk of an x-ray tube |
abstract |
An apparatus (210) and method for total or partial blanking of an electron beam (e) during a jump between the 2 or more positions of a dynamic focal spot (FP) movement in circumferential direction of the electron beam impinging on the focal track (FPTR) of a rotating target disk (230) of a X-ray tube (110). Alternatively the focal spot size can be increased during this short time interval. Overheating of the anode at the focal spot can be prevented. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10460899-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016055319-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113343459-A |
priorityDate |
2012-05-22^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |