http://rdf.ncbi.nlm.nih.gov/pubchem/reference/18227274

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contentType Journal Article
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publicationName ACS Applied Materials & Interfaces
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bibliographicCitation Hattori Y, Taniguchi T, Watanabe K, Nagashio K. Anisotropic Dielectric Breakdown Strength of Single Crystal Hexagonal Boron Nitride. ACS Appl Mater Interfaces. 2016 Oct 19;8(41):27877–84. doi: 10.1021/acsami.6b06425. PMID: 27689904.
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identifier https://pubmed.ncbi.nlm.nih.gov/27689904
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title Anisotropic Dielectric Breakdown Strength of Single Crystal Hexagonal Boron Nitride
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