reference/203442738

Predicate	Object
contentType	Journal Article
endingPage	999
issn	1543-186X 0361-5235
issueIdentifier	8
pageRange	993-999
publicationName	Journal of Electronic Materials
startingPage	993
bibliographicCitation	Mallick S, Kiran R, Ghosh S, Velicu S, Sivananthan S. Comparative Study of HgCdTe Etchants: An Electrical Characterization. Journal of Electronic Materials. 2007 Jul 18;36(8):993–9. doi: 10.1007/s11664-007-0159-8.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_d5c4cfa61d2975e3f69af07adc3fb222 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_e53f291331153b238b3da30619eefd33 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_ed46998da89bd69b5a4c9eef7589b243 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_6b94278c99631e00b42edbdd0e8ade02 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_37958c8ddeaf5b931a4cdfb3933e0d52
date	2007-07-18^^<http://www.w3.org/2001/XMLSchema#date>
identifier	https://doi.org/10.1007/s11664-007-0159-8
isPartOf	https://portal.issn.org/resource/ISSN/0361-5235 https://portal.issn.org/resource/ISSN/1543-186X http://rdf.ncbi.nlm.nih.gov/pubchem/journal/45479
language	English
source	https://scigraph.springernature.com/ https://www.crossref.org/
title	Comparative Study of HgCdTe Etchants: An Electrical Characterization

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