http://rdf.ncbi.nlm.nih.gov/pubchem/reference/204093252

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Predicate Object
contentType Journal Article
endingPage 239
issn 1432-2021
0342-1791
issueIdentifier 4
pageRange 233-239
publicationName Physics and Chemistry of Minerals
startingPage 233
bibliographicCitation Shimada Y, Okuno M, Syono Y, Kikuchi M, Fukuoka K, Ishizawa N. An X-ray diffraction study of shock-wave-densified SiO 2 glasses. Physics and Chemistry of Minerals. 2002 May 01;29(4):233–9. doi: 10.1007/s00269-001-0235-1.
creator http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_32306f8b467595156655fccded28969f
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date 2002-05-01^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://doi.org/10.1007/s00269-001-0235-1
isPartOf https://portal.issn.org/resource/ISSN/1432-2021
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/44098
language English
source https://scigraph.springernature.com/
https://www.crossref.org/
title An X-ray diffraction study of shock-wave-densified SiO 2 glasses

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