reference/206196915

Predicate	Object
contentType	Journal Article
endingPage	2301
issn	0884-2914 2044-5326
issueIdentifier	15
pageRange	2291-2301
publicationName	Journal of Materials Research
startingPage	2291
bibliographicCitation	Xie L, Feng Q, Wen Y, Wang L, Jiang C, Lu W. Surface microstructure characterization on shot peened (TiB + TiC)/Ti–6Al–4V by Rietveld whole pattern fitting method. Journal of Materials Research. 2016 Jul 12;31(15):2291–301. doi: 10.1557/jmr.2016.256.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_a4c2363e3b3b5c0228a1be1d5ccd4cd0 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_a27b199947c936ce0fd78eda674ddc30 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_455f0fe434269abff667db0aff3b32c2 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_0d76975a24c721680b7ec7191d055093 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_678c4f48402bd0c1a068269e720c5b40 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_c826042dea87aa9dc4d56c3cd2b055f2
date	2016-07-12^^<http://www.w3.org/2001/XMLSchema#date>
identifier	https://doi.org/10.1557/jmr.2016.256
isPartOf	https://portal.issn.org/resource/ISSN/0884-2914 https://portal.issn.org/resource/ISSN/2044-5326
language	English
source	https://scigraph.springernature.com/ https://www.crossref.org/
title	Surface microstructure characterization on shot peened (TiB + TiC)/Ti-6Al-4V by Rietveld whole pattern fitting method

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