reference/209986361

Predicate	Object
contentType	Journal Article
endingPage	3281
issn	1573-482X 0957-4522
issueIdentifier	5
pageRange	3275-3281
publicationName	Journal of Materials Science: Materials in Electronics
startingPage	3275
bibliographicCitation	Huan L, Tang X, Su H, Zhang H, Jing Y. Effects of SiO2 concentration on the DC-bias-superposition characteristics of the NiCuZn ferrites. Journal of Materials Science: Materials in Electronics. 2015 Feb 26;26(5):3275–81. doi: 10.1007/s10854-015-2827-4.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_2607e8406eb797a29f9e5bdff0407349 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_6f4b21cdc67a78ebf08ff013699efa6f http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_d77a2c395fca5f00ccd444ba9a239125 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_01d4519257a97affc277c5dd982464bd http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_01f46381d0a9570bab650e5922113a8b
date	2015-02-26^^<http://www.w3.org/2001/XMLSchema#date>
identifier	https://doi.org/10.1007/s10854-015-2827-4
isPartOf	https://portal.issn.org/resource/ISSN/1573-482X https://portal.issn.org/resource/ISSN/0957-4522
language	English
source	https://scigraph.springernature.com/ https://www.crossref.org/
title	Effects of SiO2 concentration on the DC-bias-superposition characteristics of the NiCuZn ferrites

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