http://rdf.ncbi.nlm.nih.gov/pubchem/reference/214310599

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endingPage 4387
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bibliographicCitation Yang X, Li C, Wang J, Zhou B, Lin S, Xie S, Li B, Zhang J, Wu L, Li W, Zhao D, Feng L, Zeng G, Hao X, Karazhanov S. Investigation of the Surface and Interfacial Properties of Polycrystalline CdTe/Monocrystalline Si Structure. Journal of Electronic Materials. 2022 May 16;51(8):4378–87. doi: 10.1007/s11664-022-09682-9.
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date 2022-05-16^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://doi.org/10.1007/s11664-022-09682-9
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/45479
language English
source https://scigraph.springernature.com/
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title Investigation of the Surface and Interfacial Properties of Polycrystalline CdTe/Monocrystalline Si Structure

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