bibliographicCitation |
Tseng YT, Lu LS, Shen FC, Wang CH, Sung HY, Chang WH, Wu WW. In Situ Atomic-Scale Observation of Monolayer MoS2 Devices under High-Voltage Biasing via Transmission Electron Microscopy. Small. 2022 Feb;18(7):e2106411. doi: 10.1002/smll.202106411. PMID: 34995002. |