| Predicate |
Object |
| contentType |
Journal Article |
| issn |
2150-5551
2311-6706 |
| issueIdentifier |
1 |
| pageRange |
181- |
| publicationName |
Nano-Micro Letters |
| startingPage |
181 |
| bibliographicCitation |
Zheng B, Gu GX. Machine Learning-Based Detection of Graphene Defects with Atomic Precision. Nano-Micro Letters. 2020 Sep 07;12(1):181. doi: 10.1007/s40820-020-00519-w. |
| creator |
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_5612414f8121d3462430ae8870db1e05
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_10d730c5180b4b0e6094b2c60f8bf74e |
| date |
2020-09-07^^<http://www.w3.org/2001/XMLSchema#date> |
| identifier |
https://doi.org/10.1007/s40820-020-00519-w
https://pubmed.ncbi.nlm.nih.gov/PMC7770819
https://pubmed.ncbi.nlm.nih.gov/34138207 |
| isPartOf |
http://rdf.ncbi.nlm.nih.gov/pubchem/journal/47611
https://portal.issn.org/resource/ISSN/2311-6706
https://portal.issn.org/resource/ISSN/2150-5551 |
| language |
English |
| source |
https://scigraph.springernature.com/
https://www.crossref.org/
https://pubmed.ncbi.nlm.nih.gov/ |
| title |
Machine Learning-Based Detection of Graphene Defects with Atomic Precision |