http://rdf.ncbi.nlm.nih.gov/pubchem/reference/34676960

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bibliographicCitation Sun X, Tiwari D, Li M, Fermin DJ. Decoupling the impact of bulk and surface point defects on the photoelectrochemical properties of LaFeO3 thin films. Chem Sci. 2022 Sep 28;13(37):11252–9. PMID: 36320475; PMCID: PMC9517707.
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date 2022-09-28^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://doi.org/10.1039/d2sc04675j
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/38564
language English
source https://pubmed.ncbi.nlm.nih.gov/
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title Decoupling the impact of bulk and surface point defects on the photoelectrochemical properties of LaFeO3 thin films
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