http://rdf.ncbi.nlm.nih.gov/pubchem/reference/3849154

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Predicate Object
contentType Journal Article
endingPage 647
issn 0909-0495
issueIdentifier Pt 4
pageRange 644-647
publicationName Journal of Synchrotron Radiation
startingPage 644
bibliographicCitation Sønsteby HH, Chernyshov D, Getz M, Nilsen O, Fjellvåg H. On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films. J Synchrotron Radiat. 2013 Jul;20(Pt 4):644–7. doi: 10.1107/s0909049513009102. PMID: 23765309.
creator http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_fc9bcac8353fd01dd44539fe68117110
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http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_5ac8c69c4bcc6296459f7d201eadae2c
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date 2013-05-01^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://pubmed.ncbi.nlm.nih.gov/23765309
https://doi.org/10.1107/s0909049513009102
isPartOf https://portal.issn.org/resource/ISSN/0909-0495
http://rdf.ncbi.nlm.nih.gov/pubchem/journal/22439
language English
source https://pubmed.ncbi.nlm.nih.gov/
https://www.crossref.org/
title On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films

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